Layered indium selenide (InSe) has emerged as a promising two-dimensional semiconductor due to its high electron mobility and direct optical bandgap in the few-layer limit. As InSe is integrated into high-performance electronic and optoelectronic systems, thermal management will become critical, thus motivating detailed characterization of intrinsic thermal properties. Here, we report the room-temperature thermal conductivity of exfoliated crystals of InSe along the through-plane and in-plane directions using conventional and beam offset time-domain thermoreflectance (TDTR), respectively. InSe crystals with varying thicknesses were prepared by mechanical exfoliation onto Si(100) wafers followed by immediate encapsulation with a 3-nm-thick AlOx passivation layer to prevent ambient degradation prior to coating with metal films for TDTR measurements. The measured thermal conductivity in the in-plane direction, Λin ≈ 8.5 ± 2 W/m K, is an order of magnitude higher than that in the through-plane direction, Λthrough ≈ 0.76±0.15 W/m K, which implies a high thermal anisotropy ≈11 ± 3. These relatively high anisotropy and low thermal conductivity compared to other layered semiconductors imply that InSe will require unique thermal management considerations when implemented in electronic, optoelectronic, and thermoelectric applications.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)