TY - GEN
T1 - Analytical precision limits in slitless spectroscopy
AU - Oktem, Figen S.
AU - Kamalabadi, Farzad
PY - 2012
Y1 - 2012
N2 - We consider the problem of estimating emission line parameters from the measurements of a multi-order slitless spectrometer. This problem can be viewed as a multi-frame deblurring problem with shift variant Gaussian blur. By using Cramer-Rao lower bound theory, we derive analytical precision limits to this parameter estimation when the measurements are corrupted with Gaussian noise. The derivation involves an approximation to the Fisher information matrix in order to obtain closed-form expressions. An important feature of our treatment is to provide a framework for exploring the optimized instrument requirements, including various potential observing scenarios, spatial and spectral resolutions, and signal-to-noise ratio.
AB - We consider the problem of estimating emission line parameters from the measurements of a multi-order slitless spectrometer. This problem can be viewed as a multi-frame deblurring problem with shift variant Gaussian blur. By using Cramer-Rao lower bound theory, we derive analytical precision limits to this parameter estimation when the measurements are corrupted with Gaussian noise. The derivation involves an approximation to the Fisher information matrix in order to obtain closed-form expressions. An important feature of our treatment is to provide a framework for exploring the optimized instrument requirements, including various potential observing scenarios, spatial and spectral resolutions, and signal-to-noise ratio.
UR - http://www.scopus.com/inward/record.url?scp=84868224776&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84868224776&partnerID=8YFLogxK
U2 - 10.1109/SSP.2012.6319734
DO - 10.1109/SSP.2012.6319734
M3 - Conference contribution
AN - SCOPUS:84868224776
SN - 9781467301831
T3 - 2012 IEEE Statistical Signal Processing Workshop, SSP 2012
SP - 468
EP - 471
BT - 2012 IEEE Statistical Signal Processing Workshop, SSP 2012
T2 - 2012 IEEE Statistical Signal Processing Workshop, SSP 2012
Y2 - 5 August 2012 through 8 August 2012
ER -