Analytical precision limits in slitless spectroscopy

Figen S. Oktem, Farzad Kamalabadi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We consider the problem of estimating emission line parameters from the measurements of a multi-order slitless spectrometer. This problem can be viewed as a multi-frame deblurring problem with shift variant Gaussian blur. By using Cramer-Rao lower bound theory, we derive analytical precision limits to this parameter estimation when the measurements are corrupted with Gaussian noise. The derivation involves an approximation to the Fisher information matrix in order to obtain closed-form expressions. An important feature of our treatment is to provide a framework for exploring the optimized instrument requirements, including various potential observing scenarios, spatial and spectral resolutions, and signal-to-noise ratio.

Original languageEnglish (US)
Title of host publication2012 IEEE Statistical Signal Processing Workshop, SSP 2012
Pages468-471
Number of pages4
DOIs
StatePublished - Nov 6 2012
Event2012 IEEE Statistical Signal Processing Workshop, SSP 2012 - Ann Arbor, MI, United States
Duration: Aug 5 2012Aug 8 2012

Publication series

Name2012 IEEE Statistical Signal Processing Workshop, SSP 2012

Other

Other2012 IEEE Statistical Signal Processing Workshop, SSP 2012
CountryUnited States
CityAnn Arbor, MI
Period8/5/128/8/12

ASJC Scopus subject areas

  • Signal Processing

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  • Cite this

    Oktem, F. S., & Kamalabadi, F. (2012). Analytical precision limits in slitless spectroscopy. In 2012 IEEE Statistical Signal Processing Workshop, SSP 2012 (pp. 468-471). [6319734] (2012 IEEE Statistical Signal Processing Workshop, SSP 2012). https://doi.org/10.1109/SSP.2012.6319734