Analysis of variance-reduction schemes for ensemble monte carlo simulation of semiconductor devices

A. Pacelli, U. Ravaioli

Research output: Contribution to journalArticlepeer-review

Abstract

A detailed discussion of variance-reduction techniques for Monte Carlo device simulation is presented. The use of variable statistical particle weights is examined from the point of view of numerical accuracy and physical consistency. An improved splitting/gathering technique is presented, which operates on the entire ensemble of particles rather than on particles located in one region of phase space. Application of the method to self-consistent ensemble simulation is also discussed, showing that the use of variable-weight techniques is limited to cases where the effect of short-range Coulomb interaction is negligible. Examples are given for simple space-homogeneous and one-dimensional cases, and for a submicron n-MOSFET device.

Original languageEnglish (US)
Pages (from-to)599-605
Number of pages7
JournalSolid-State Electronics
Volume41
Issue number4
DOIs
StatePublished - Apr 1997

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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