Analysis of spurious velocity overshoot in hydrodynamic simulations

Datong Chen, Enrico Sangiorgi, Mark R. Pinto, Edwin C. Kan, Umberto Ravaioli, Robert W. Dutton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The detailed physical and mathematical causes of the spurious velocity overshoot spike, observed in hydrodynamic simulations of mn diodes, are investigated. The magnitude of the spike is related to the variation of the heat conduction coefficient in the conventional formulation. Results obtained using a recently proposed energy transport, model are presented which show virtually no spurious spike without any adhoc parameter variation.

Original languageEnglish (US)
Title of host publicationWorkshop on Numerical Modeling of Processes and Devices for Integrated Circuits, NUPAD 1992
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages109-114
Number of pages6
ISBN (Electronic)0780305167, 9780780305168
DOIs
StatePublished - Jan 1 1992
Event4th Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, NUPAD 1992 - Seattle, United States
Duration: May 31 1992Jun 1 1992

Publication series

NameWorkshop on Numerical Modeling of Processes and Devices for Integrated Circuits, NUPAD 1992

Conference

Conference4th Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, NUPAD 1992
CountryUnited States
CitySeattle
Period5/31/926/1/92

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Modeling and Simulation
  • Numerical Analysis

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