Analysis of large system black-box test data

Kent C. Clapp; Ravishankar K. Iyer; Ytzhak Levendel

doi:10.1109/ISSRE.1992.285854

Analysis of large system black-box test data

Kent C. Clapp, Ravishankar K. Iyer, Ytzhak Levendel

Research output: Contribution to journal › Conference article › peer-review

Abstract

This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.

Original language	English (US)
Article number	285854
Pages (from-to)	94-103
Number of pages	10
Journal	Proceedings - International Symposium on Software Reliability Engineering, ISSRE
DOIs	https://doi.org/10.1109/ISSRE.1992.285854
State	Published - 1992
Event	3rd International Symposium on Software Reliability Engineering, ISSRE 1992 - Research Triangle Park, United States Duration: Oct 7 1992 → Oct 10 1992

Keywords

Analysis
Fault/repair data
Software testing
Test minimization
Validation

ASJC Scopus subject areas

Software
Safety, Risk, Reliability and Quality

Online availability

10.1109/ISSRE.1992.285854

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title = "Analysis of large system black-box test data",

abstract = "This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.",

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author = "Clapp, {Kent C.} and Iyer, {Ravishankar K.} and Ytzhak Levendel",

note = "Publisher Copyright: {\textcopyright} 1992 IEEE.; 3rd International Symposium on Software Reliability Engineering, ISSRE 1992 ; Conference date: 07-10-1992 Through 10-10-1992",

year = "1992",

doi = "10.1109/ISSRE.1992.285854",

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journal = "Proceedings - International Symposium on Software Reliability Engineering, ISSRE",

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AU - Iyer, Ravishankar K.

AU - Levendel, Ytzhak

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Y1 - 1992

N2 - This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.

AB - This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.

KW - Analysis

KW - Fault/repair data

KW - Software testing

KW - Test minimization

KW - Validation

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DO - 10.1109/ISSRE.1992.285854

M3 - Conference article

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JO - Proceedings - International Symposium on Software Reliability Engineering, ISSRE

JF - Proceedings - International Symposium on Software Reliability Engineering, ISSRE

M1 - 285854

T2 - 3rd International Symposium on Software Reliability Engineering, ISSRE 1992

Y2 - 7 October 1992 through 10 October 1992

ER -

Analysis of large system black-box test data

Abstract

Keywords

ASJC Scopus subject areas

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