Abstract

This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.

Original languageEnglish (US)
Article number285854
Pages (from-to)94-103
Number of pages10
JournalProceedings - International Symposium on Software Reliability Engineering, ISSRE
DOIs
StatePublished - Jan 1 1992
Event3rd International Symposium on Software Reliability Engineering, ISSRE 1992 - Research Triangle Park, United States
Duration: Oct 7 1992Oct 10 1992

Fingerprint

Black-box testing
Testing
Redundancy
Repair
Costs

Keywords

  • Analysis
  • Fault/repair data
  • Software testing
  • Test minimization
  • Validation

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality

Cite this

Analysis of large system black-box test data. / Clapp, Kent C.; Iyer, Ravishankar K; Levendel, Ytzhak.

In: Proceedings - International Symposium on Software Reliability Engineering, ISSRE, 01.01.1992, p. 94-103.

Research output: Contribution to journalConference article

@article{1b972077cdb8491e9faa7153b13e4105,
title = "Analysis of large system black-box test data",
abstract = "This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.",
keywords = "Analysis, Fault/repair data, Software testing, Test minimization, Validation",
author = "Clapp, {Kent C.} and Iyer, {Ravishankar K} and Ytzhak Levendel",
year = "1992",
month = "1",
day = "1",
doi = "10.1109/ISSRE.1992.285854",
language = "English (US)",
pages = "94--103",
journal = "Proceedings of the International Symposium on Software Reliability Engineering, ISSRE",
issn = "1071-9458",

}

TY - JOUR

T1 - Analysis of large system black-box test data

AU - Clapp, Kent C.

AU - Iyer, Ravishankar K

AU - Levendel, Ytzhak

PY - 1992/1/1

Y1 - 1992/1/1

N2 - This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.

AB - This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.

KW - Analysis

KW - Fault/repair data

KW - Software testing

KW - Test minimization

KW - Validation

UR - http://www.scopus.com/inward/record.url?scp=71049135917&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=71049135917&partnerID=8YFLogxK

U2 - 10.1109/ISSRE.1992.285854

DO - 10.1109/ISSRE.1992.285854

M3 - Conference article

AN - SCOPUS:71049135917

SP - 94

EP - 103

JO - Proceedings of the International Symposium on Software Reliability Engineering, ISSRE

JF - Proceedings of the International Symposium on Software Reliability Engineering, ISSRE

SN - 1071-9458

M1 - 285854

ER -