Abstract

This paper studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing cost and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated.

Original languageEnglish (US)
Article number285854
Pages (from-to)94-103
Number of pages10
JournalProceedings - International Symposium on Software Reliability Engineering, ISSRE
DOIs
StatePublished - Jan 1 1992
Event3rd International Symposium on Software Reliability Engineering, ISSRE 1992 - Research Triangle Park, United States
Duration: Oct 7 1992Oct 10 1992

    Fingerprint

Keywords

  • Analysis
  • Fault/repair data
  • Software testing
  • Test minimization
  • Validation

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality

Cite this