An investigation of external latchup

Farzan Farbiz, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual
Pages600-601
Number of pages2
DOIs
StatePublished - 2007
Event45th Annual IEEE International Reliability Physics Symposium 2007, IRPS - Phoenix, AZ, United States
Duration: Apr 15 2007Apr 19 2007

Other

Other45th Annual IEEE International Reliability Physics Symposium 2007, IRPS
Country/TerritoryUnited States
CityPhoenix, AZ
Period4/15/074/19/07

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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