An investigation of external latchup

Farzan Farbiz, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual
Pages600-601
Number of pages2
DOIs
StatePublished - 2007
Event45th Annual IEEE International Reliability Physics Symposium 2007, IRPS - Phoenix, AZ, United States
Duration: Apr 15 2007Apr 19 2007

Other

Other45th Annual IEEE International Reliability Physics Symposium 2007, IRPS
CountryUnited States
CityPhoenix, AZ
Period4/15/074/19/07

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Farbiz, F., & Rosenbaum, E. (2007). An investigation of external latchup. In 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual (pp. 600-601). [4227711] https://doi.org/10.1109/RELPHY.2007.369970