An Experimental Report on Correlated-Photon Ellipsometry

Kimani C. Toussaint, Giovanni Di Giuseppe, Alexander V. Sergienko, Bahaa E.A. Saleh, Malvin C. Teich

Research output: Contribution to journalConference article

Abstract

Traditional ellipsometric measurements are limited in their accuracy because of the use of an external reference sample for calibration, and because of the noise inherent in the source at low light levels. We demonstrate that these limitations can be circumvented by using a non-classical source of light, namely, twin photons generated by the process of spontaneous parametric downconversion, in conjunction with a novel polarization interferometer and coincidence-counting detection scheme. The twin-photon nature of the source is a unique feature of our scheme. We are guaranteed, on the detection of a photon in one of the arms of the setup, that its twin will be in the other. We present experimental results showing how the technique operates.

Original languageEnglish (US)
Pages (from-to)168-175
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5158
StatePublished - Dec 1 2003
EventPolarization Science and Remote Sensing - San Diego, CA, United States
Duration: Aug 3 2003Aug 5 2003

Fingerprint

Ellipsometry
ellipsometry
Photon
Photons
photons
Coincidence
Interferometer
Interferometers
Light sources
Counting
counting
Calibration
Polarization
interferometers
Experimental Results
polarization
Demonstrate

Keywords

  • Ellipsometry
  • Nonlinear optics
  • Quantum optics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Toussaint, K. C., Di Giuseppe, G., Sergienko, A. V., Saleh, B. E. A., & Teich, M. C. (2003). An Experimental Report on Correlated-Photon Ellipsometry. Proceedings of SPIE - The International Society for Optical Engineering, 5158, 168-175.

An Experimental Report on Correlated-Photon Ellipsometry. / Toussaint, Kimani C.; Di Giuseppe, Giovanni; Sergienko, Alexander V.; Saleh, Bahaa E.A.; Teich, Malvin C.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 5158, 01.12.2003, p. 168-175.

Research output: Contribution to journalConference article

Toussaint, KC, Di Giuseppe, G, Sergienko, AV, Saleh, BEA & Teich, MC 2003, 'An Experimental Report on Correlated-Photon Ellipsometry', Proceedings of SPIE - The International Society for Optical Engineering, vol. 5158, pp. 168-175.
Toussaint KC, Di Giuseppe G, Sergienko AV, Saleh BEA, Teich MC. An Experimental Report on Correlated-Photon Ellipsometry. Proceedings of SPIE - The International Society for Optical Engineering. 2003 Dec 1;5158:168-175.
Toussaint, Kimani C. ; Di Giuseppe, Giovanni ; Sergienko, Alexander V. ; Saleh, Bahaa E.A. ; Teich, Malvin C. / An Experimental Report on Correlated-Photon Ellipsometry. In: Proceedings of SPIE - The International Society for Optical Engineering. 2003 ; Vol. 5158. pp. 168-175.
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