TY - GEN
T1 - An exact algorithm for the statistical shortest path problem
AU - Deng, Liang
AU - Wong, Martin D.F.
PY - 2006
Y1 - 2006
N2 - Graph algorithms are widely used in VLSI CAD. Traditional graph algorithms can handle graphs with deterministic edge weights. As VLSI technology continues to scale into nanometer designs, we need to use probability distributions for edge weights in order to model uncertainty due to parameter variations. In this paper, we consider the statistical shortest path (SSP) problem. Given a graph G, the edge weights of G are random variables. For each path P in G, let L P be its length, which is the sum of all edge weights on P. Clearly LP is a random variable and we let μP and σP2 be its mean and variance, respectively. In the SSP problem, our goal is to find a path P connecting two given vertices to minimize the cost function μP + Φ(σP 2) where Φ is an arbitrary function. (For example, if Φ (x) = 3√x, the cost function is μP + 3σP.) To minimize uncertainty in the final result, it is meaningful to look for paths with bounded variance, i.e., σP2 ≤ B for a given fixed bound B. In this paper, we present an exact algorithm to solve the SSP problem in O(B(V + E)) time where V and E are the numbers of vertices and edges, respectively, in G. Our algorithm is superior to previous algorithms for SSP problem because we can handle: 1) general graphs (unlike previous works applicable only to directed acyclic graphs), 2) arbitrary edge-weight distributions (unlike previous algorithms designed only for specific distributions such as Gaussian), and 3) general cost function (none of the previous algorithms can even handle the cost function μP + 3σP. Finally, we discuss applications of the SSP problem to maze routing, buffer insertions, and timing analysis under parameter variations.
AB - Graph algorithms are widely used in VLSI CAD. Traditional graph algorithms can handle graphs with deterministic edge weights. As VLSI technology continues to scale into nanometer designs, we need to use probability distributions for edge weights in order to model uncertainty due to parameter variations. In this paper, we consider the statistical shortest path (SSP) problem. Given a graph G, the edge weights of G are random variables. For each path P in G, let L P be its length, which is the sum of all edge weights on P. Clearly LP is a random variable and we let μP and σP2 be its mean and variance, respectively. In the SSP problem, our goal is to find a path P connecting two given vertices to minimize the cost function μP + Φ(σP 2) where Φ is an arbitrary function. (For example, if Φ (x) = 3√x, the cost function is μP + 3σP.) To minimize uncertainty in the final result, it is meaningful to look for paths with bounded variance, i.e., σP2 ≤ B for a given fixed bound B. In this paper, we present an exact algorithm to solve the SSP problem in O(B(V + E)) time where V and E are the numbers of vertices and edges, respectively, in G. Our algorithm is superior to previous algorithms for SSP problem because we can handle: 1) general graphs (unlike previous works applicable only to directed acyclic graphs), 2) arbitrary edge-weight distributions (unlike previous algorithms designed only for specific distributions such as Gaussian), and 3) general cost function (none of the previous algorithms can even handle the cost function μP + 3σP. Finally, we discuss applications of the SSP problem to maze routing, buffer insertions, and timing analysis under parameter variations.
UR - http://www.scopus.com/inward/record.url?scp=33748618417&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33748618417&partnerID=8YFLogxK
U2 - 10.1145/1118299.1118515
DO - 10.1145/1118299.1118515
M3 - Conference contribution
AN - SCOPUS:33748618417
SN - 0780394518
SN - 9780780394513
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 965
EP - 970
BT - Proceedings of the ASP-DAC 2006
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006
Y2 - 24 January 2006 through 27 January 2006
ER -