An energy-efficient ECG processor in 45-nm CMOS using statistical error compensation

Rami A. Abdallah, Naresh R. Shanbhag

Research output: Contribution to journalArticlepeer-review

Abstract

A subthreshold ECG processor in 45-nm IBM SOI CMOS is designed to operate at the minimum energy operating point (MEOP). Statistical error compensation (SEC) is employed to further reduce energy (E-{\min}) at the MEOP. SEC is shown to reduce E\min by 28% compared with the conventional (error-free) case while maintaining acceptable beat-detection performance. SEC enables the supply voltage to be scaled to 15% below its critical value at MEOP, while compensating for a 58% precorrection error rate pe. These results represent an improvement of 19× in beat-detection performance and 600× in pe over conventional (error-free) systems. The prototype IC consumes 14.5 fJ/cycle/1k-gate and exhibits 4.7× better energy efficiency than the state of the art while tolerating 16× more voltage variations.

Original languageEnglish (US)
Article number6600915
Pages (from-to)2882-2893
Number of pages12
JournalIEEE Journal of Solid-State Circuits
Volume48
Issue number11
DOIs
StatePublished - 2013

Keywords

  • Error resiliency
  • robust design
  • statistical computing
  • subthreshold
  • ultralow power
  • voltage overscaling

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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