An energy-efficient circuit technique for single event transient noise-tolerance

Ming Zhang, Naresh R.Shanbhag

Research output: Contribution to journalConference articlepeer-review


Presented is a circuit technique that mitigates the impact of single event transient (SET) noise in deep submicron (DSM) circuits with minimal speed, power and area penalty. The technique combines a novel dual-sampling flip-flop (DSFF) and a skewed CMOS (SCMOS) circuit style. The DSFF and SCMOS are designed to eliminate SETs with the polarity of 1-0-1 and 0-1-0, respectively. We present a case study of inverter chain circuits in a typical 0.18 μm process under the influence of radiation induced soft errors. We quantify the SET-tolerance of the proposed technique by simulating the circuits soft error rate (SER) using a recently developed tool SERA (Soft Error Rate Analyzer). The results show that the DSFF latches the input without any speed penalty comparing to a conventional flip-flop, if no soft error has occurred. Otherwise, the DSFF alone eliminates the 1-0-1 SETs while incurring a worst-case speed and power penalty of 310 ps and 39 μW/GHz, respectively. The proposed technique can completely eliminate the impact of SETs with both polarities when tuned appropriately.

Original languageEnglish (US)
Article number1464668
Pages (from-to)636-639
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
StatePublished - 2005
EventIEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan
Duration: May 23 2005May 26 2005

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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