An automated and efficient substrate noise analysis tool

Hongmei Li; Cole E. Zemke; Giorgos Manetas; Vladimir I. Okhmatovski; Elyse Rosenbaum

doi:10.1109/TCAD.2005.854628

An automated and efficient substrate noise analysis tool

Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum

Research output: Contribution to journal › Article › peer-review

Abstract

This paper presents a methodology for the efficient modeling of substrate noise coupling. A closed-form Green's function for nonuniformly doped substrates is employed with the correct singular characteristics. A novel global surface impedance matrix scheme is introduced to efficiently model nonuniformly doped wells, channel stop implants, and buried layers. Layout, device, and netlist extractors are developed so as to integrate our boundary element method (BEM) solver with commercial layout and circuit simulation tools.

Original language	English (US)
Pages (from-to)	454-468
Number of pages	15
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	25
Issue number	3
DOIs	https://doi.org/10.1109/TCAD.2005.854628
State	Published - Mar 2006

Keywords

Circuit
Layout
Modeling
Noise analysis
Simulation
Substrate
System on a chip
Very large scale integrated (VLSI)

ASJC Scopus subject areas

Software
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering

Online availability

10.1109/TCAD.2005.854628

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keywords = "Circuit, Layout, Modeling, Noise analysis, Simulation, Substrate, System on a chip, Very large scale integrated (VLSI)",

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note = "Funding Information: Manuscript received June 15, 2004; revised January 20, 2005. This work was supported in part by the Semiconductor Research Corporation under Grant 790.001. The work of H. Li was supported under the Motorola University Partners in Research program. This paper was recommended by Associate Editor L. M. Silveira.",

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AU - Manetas, Giorgos

AU - Okhmatovski, Vladimir I.

AU - Rosenbaum, Elyse

N1 - Funding Information: Manuscript received June 15, 2004; revised January 20, 2005. This work was supported in part by the Semiconductor Research Corporation under Grant 790.001. The work of H. Li was supported under the Motorola University Partners in Research program. This paper was recommended by Associate Editor L. M. Silveira.

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AB - This paper presents a methodology for the efficient modeling of substrate noise coupling. A closed-form Green's function for nonuniformly doped substrates is employed with the correct singular characteristics. A novel global surface impedance matrix scheme is introduced to efficiently model nonuniformly doped wells, channel stop implants, and buried layers. Layout, device, and netlist extractors are developed so as to integrate our boundary element method (BEM) solver with commercial layout and circuit simulation tools.

KW - Circuit

KW - Layout

KW - Modeling

KW - Noise analysis

KW - Simulation

KW - Substrate

KW - System on a chip

KW - Very large scale integrated (VLSI)

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An automated and efficient substrate noise analysis tool

Abstract

Keywords

ASJC Scopus subject areas

Online availability

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