An automated and efficient substrate noise analysis tool

Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum

Research output: Contribution to journalArticle

Abstract

This paper presents a methodology for the efficient modeling of substrate noise coupling. A closed-form Green's function for nonuniformly doped substrates is employed with the correct singular characteristics. A novel global surface impedance matrix scheme is introduced to efficiently model nonuniformly doped wells, channel stop implants, and buried layers. Layout, device, and netlist extractors are developed so as to integrate our boundary element method (BEM) solver with commercial layout and circuit simulation tools.

Original languageEnglish (US)
Pages (from-to)454-468
Number of pages15
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume25
Issue number3
DOIs
StatePublished - Mar 1 2006

Fingerprint

Circuit simulation
Substrates
Boundary element method
Green's function

Keywords

  • Circuit
  • Layout
  • Modeling
  • Noise analysis
  • Simulation
  • Substrate
  • System on a chip
  • Very large scale integrated (VLSI)

ASJC Scopus subject areas

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

An automated and efficient substrate noise analysis tool. / Li, Hongmei; Zemke, Cole E.; Manetas, Giorgos; Okhmatovski, Vladimir I.; Rosenbaum, Elyse.

In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 25, No. 3, 01.03.2006, p. 454-468.

Research output: Contribution to journalArticle

Li, Hongmei ; Zemke, Cole E. ; Manetas, Giorgos ; Okhmatovski, Vladimir I. ; Rosenbaum, Elyse. / An automated and efficient substrate noise analysis tool. In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2006 ; Vol. 25, No. 3. pp. 454-468.
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