An automated and efficient substrate noise analysis tool

Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum

Research output: Contribution to journalArticlepeer-review


This paper presents a methodology for the efficient modeling of substrate noise coupling. A closed-form Green's function for nonuniformly doped substrates is employed with the correct singular characteristics. A novel global surface impedance matrix scheme is introduced to efficiently model nonuniformly doped wells, channel stop implants, and buried layers. Layout, device, and netlist extractors are developed so as to integrate our boundary element method (BEM) solver with commercial layout and circuit simulation tools.

Original languageEnglish (US)
Pages (from-to)454-468
Number of pages15
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue number3
StatePublished - Mar 2006


  • Circuit
  • Layout
  • Modeling
  • Noise analysis
  • Simulation
  • Substrate
  • System on a chip
  • Very large scale integrated (VLSI)

ASJC Scopus subject areas

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering


Dive into the research topics of 'An automated and efficient substrate noise analysis tool'. Together they form a unique fingerprint.

Cite this