@inproceedings{ea87536d05964dc68a830ecac5a60a0a,
title = "An analysis of bipolar breakdown and its application to the design of ESD protection circuits",
abstract = "Analytical expressions for the breakdown voltage of an NPN with a resistively grounded base, both with and without the Zener diode trigger which is used in a common ESD protection circuit, are presented for the first time. The results are used to explain anomalous behavior in the I-V curve of the protection circuit, and to achieve a more efficient ESD protection circuit design.",
keywords = "Application software, BiCMOS integrated circuits, Breakdown voltage, Circuit synthesis, Diodes, Electric breakdown, Electrostatic discharge, Protection, Resistors, Space charge",
author = "S. Joshi and R. Ida and P. Givelin and Elyse Rosenbaum",
year = "2001",
doi = "10.1109/RELPHY.2001.922908",
language = "English (US)",
series = "Annual Proceedings - Reliability Physics (Symposium)",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "240--245",
booktitle = "2001 IEEE International Reliability Physics Symposium Proceedings - 39th Annual",
address = "United States",
note = "39th Annual IEEE International Reliability Physics Symposium, IRPS 2001 ; Conference date: 30-04-2001 Through 03-05-2001",
}