AMS policy on plagiarism and self-plagiarism

David M. Schultz; Robert M. Rauber; Kenneth F. Heideman

doi:10.1175/2015JTECH1111.1

AMS policy on plagiarism and self-plagiarism

David M. Schultz
, Robert M. Rauber
, Kenneth F. Heideman

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Pages (from-to)	193-194
Number of pages	2
Journal	Journal of Atmospheric and Oceanic Technology
Volume	32
Issue number	2
DOIs	https://doi.org/10.1175/2015JTECH1111.1
State	Published - 2015

ASJC Scopus subject areas

Ocean Engineering
Atmospheric Science

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10.1175/2015JTECH1111.1

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title = "AMS policy on plagiarism and self-plagiarism",

author = "Schultz, \{David M.\} and Rauber, \{Robert M.\} and Heideman, \{Kenneth F.\}",

year = "2015",

doi = "10.1175/2015JTECH1111.1",

language = "English (US)",

volume = "32",

pages = "193--194",

journal = "Journal of Atmospheric and Oceanic Technology",

issn = "0739-0572",

publisher = "American Meteorological Society",

number = "2",

}

TY - JOUR

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AU - Schultz, David M.

AU - Rauber, Robert M.

AU - Heideman, Kenneth F.

PY - 2015

Y1 - 2015

UR - https://www.scopus.com/pages/publications/84922963811

UR - https://www.scopus.com/pages/publications/84922963811#tab=citedBy

U2 - 10.1175/2015JTECH1111.1

DO - 10.1175/2015JTECH1111.1

M3 - Editorial

AN - SCOPUS:84922963811

SN - 0739-0572

VL - 32

SP - 193

EP - 194

JO - Journal of Atmospheric and Oceanic Technology

JF - Journal of Atmospheric and Oceanic Technology

IS - 2

ER -

AMS policy on plagiarism and self-plagiarism

ASJC Scopus subject areas

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