AMS policy on plagiarism and self-plagiarism

David M. Schultz; Robert M. Rauber; Kenneth F. Heideman

doi:10.1175/2015JTECH1111.1

AMS policy on plagiarism and self-plagiarism

David M. Schultz, Robert M. Rauber, Kenneth F. Heideman

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Pages (from-to)	193-194
Number of pages	2
Journal	Journal of Atmospheric and Oceanic Technology
Volume	32
Issue number	2
DOIs	https://doi.org/10.1175/2015JTECH1111.1
State	Published - 2015

ASJC Scopus subject areas

Ocean Engineering
Atmospheric Science

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10.1175/2015JTECH1111.1

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title = "AMS policy on plagiarism and self-plagiarism",

author = "Schultz, {David M.} and Rauber, {Robert M.} and Heideman, {Kenneth F.}",

year = "2015",

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pages = "193--194",

journal = "Journal of Atmospheric and Oceanic Technology",

issn = "0739-0572",

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AU - Heideman, Kenneth F.

PY - 2015

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JO - Journal of Atmospheric and Oceanic Technology

JF - Journal of Atmospheric and Oceanic Technology

IS - 2

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AMS policy on plagiarism and self-plagiarism

ASJC Scopus subject areas

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