All-optical format conversion of NRZ-OOK to RZ-OOK in a silicon nanowire utilizing either XPM or FWM and resulting in a receiver sensitivity gain of ∼2.5 dB

W. Astar, Jeffrey B. Driscoll, Xiaoping Liu, Jerry I. Dadap, William M.J. Green, Yurii A. Vlasov, Gary M. Carter, Richard M. Osgood

Research output: Contribution to journalArticlepeer-review

Abstract

All-optical format conversion of 10 Gb/s non-return-to-zero on-off keying (NRZ-OOK) to RZ-OOK has been successfully achieved, for the first time to our knowledge, utilizing either cross-phase modulation (XPM) or four-wave mixing (FWM), in a Silicon (Si) nanowire. A 10-9-bit-error-rate (BER) receiver sensitivity gain of ∼2.8 dB was obtained for converted RZ-OOK relative to NRZ-OOK using XPM, whereas a receiver sensitivity gain of ∼2.5 dB was found for the FWM anti-Stokes RZ-OOK. Simultaneous wavelength and pulse format conversions were possible with FWM. No evidence of an error floor for BER 10-10 was observed in either technique. The converted RZ-OOK signal was also correctly encoded and of the correct polarity.

Original languageEnglish (US)
Article number5398903
Pages (from-to)234-249
Number of pages16
JournalIEEE Journal on Selected Topics in Quantum Electronics
Volume16
Issue number1
DOIs
StatePublished - Jan 2010
Externally publishedYes

Keywords

  • Cross-phase modulation
  • Format conversion
  • Four-wave mixing
  • Nonlinear optics
  • Silicon nanowires

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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