TY - JOUR
T1 - AlGaN/GaN HEMT-based fully monolithic X-band low noise amplifier
AU - Schwindt, R.
AU - Kumar, V.
AU - Aktas, O.
AU - Lee, J. W.
AU - Adesida, I.
PY - 2005
Y1 - 2005
N2 - A fully monolithic AlGaN/GaN HEMT-based low noise amplifier is reported. The circuit demonstrated a noise figure of 3.5 dB, gain of -7.5 dB, input return loss of -7.5 dB, and output return loss of -15 dB at 8.5 GHz. The dc characteristics of individual 0.25-μm × 150-μm transistors were: maximum current density of 1.0 A/mm, maximum transconductance of 170 mS/mm and a threshold voltage of -6.8 V. The devices have a typical short circuit current gain cutoff frequency of 24.5 GHz and a maximum oscillating frequency of 48 GHz. The devices demonstrated a minimum noise figure of 1.6 dB with an associated gain of 10.6 dB at 10 GHz.
AB - A fully monolithic AlGaN/GaN HEMT-based low noise amplifier is reported. The circuit demonstrated a noise figure of 3.5 dB, gain of -7.5 dB, input return loss of -7.5 dB, and output return loss of -15 dB at 8.5 GHz. The dc characteristics of individual 0.25-μm × 150-μm transistors were: maximum current density of 1.0 A/mm, maximum transconductance of 170 mS/mm and a threshold voltage of -6.8 V. The devices have a typical short circuit current gain cutoff frequency of 24.5 GHz and a maximum oscillating frequency of 48 GHz. The devices demonstrated a minimum noise figure of 1.6 dB with an associated gain of 10.6 dB at 10 GHz.
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U2 - 10.1002/pssc.200461544
DO - 10.1002/pssc.200461544
M3 - Article
AN - SCOPUS:27344456602
SN - 1610-1634
VL - 2
SP - 2631
EP - 2634
JO - Physica Status Solidi C: Conferences
JF - Physica Status Solidi C: Conferences
IS - 7
ER -