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ALD Al
2
O
3
passivated MBE-grown AlGaN/GaN HEMTs on 6H-SiC
D. H. Kim
, V. Kumar
, G. Chen
, A. M. Dabiran
, A. M. Wowchak
, A. Osinsky
, I. Adesida
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2
O
3
passivated MBE-grown AlGaN/GaN HEMTs on 6H-SiC'. Together they form a unique fingerprint.
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Keyphrases
Aluminum Oxide
100%
Passivated
100%
GaN HEMT
100%
Atomic Layer Deposited
100%
6H-SiC
100%
Fmax
66%
I-V Characteristics
33%
Drain Bias
33%
Power Output
33%
Maximum Oscillation Frequency
33%
Al2O3 Layer
33%
Associated Gain
33%
Unity Gain Cut-off Frequency
33%
Pulsed I-V
33%
Al2O3 Passivation Layer
33%
Engineering
Atomic Layer
100%
Current-Voltage Characteristic
33%
Cutoff Frequency
33%
Max
33%
Output Power
33%
Passivation Layer
33%
Drain Bias
33%
Earth and Planetary Sciences
Molecular Beam Epitaxy
100%