Aging in a relaxor ferroelectric: scaling and memory effects

Eugene V. Colla; Lambert K. Chao; M. B. Weissman; Dwight D. Viehland

doi:10.1103/PhysRevLett.85.3033

Aging in a relaxor ferroelectric: scaling and memory effects

Eugene V. Colla, Lambert K. Chao, M. B. Weissman, Dwight D. Viehland

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Aging holes in the out-of-phase dielectric susceptibility χ″ of the relaxor ferroelectric, PMN, were measured. It was observed that PMN has a low-T regime which exhibits not only the generic and nearly ubiquitous '1/f' distribution of long relaxation times, but also a specific (wt_A)^-T scaling relation found for aging in spin glasses and expected for some hierarchical glassy kinetics models.

Original language	English (US)
Pages (from-to)	3033-3036
Number of pages	4
Journal	Physical review letters
Volume	85
Issue number	14
DOIs	https://doi.org/10.1103/PhysRevLett.85.3033
State	Published - Oct 2 2000

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Aging in a relaxor ferroelectric: scaling and memory effects

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