Aging in a relaxor ferroelectric: scaling and memory effects

Eugene V. Colla, Lambert K. Chao, M. B. Weissman, Dwight D. Viehland

Research output: Contribution to journalArticlepeer-review

Abstract

Aging holes in the out-of-phase dielectric susceptibility χ″ of the relaxor ferroelectric, PMN, were measured. It was observed that PMN has a low-T regime which exhibits not only the generic and nearly ubiquitous '1/f' distribution of long relaxation times, but also a specific (wtA)-T scaling relation found for aging in spin glasses and expected for some hierarchical glassy kinetics models.

Original languageEnglish (US)
Pages (from-to)3033-3036
Number of pages4
JournalPhysical review letters
Volume85
Issue number14
DOIs
StatePublished - Oct 2 2000

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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