Aging in a relaxor ferroelectric: scaling and memory effects

Eugene V. Colla, Lambert K. Chao, M. B. Weissman, Dwight D. Viehland

Research output: Contribution to journalArticlepeer-review


Aging holes in the out-of-phase dielectric susceptibility χ″ of the relaxor ferroelectric, PMN, were measured. It was observed that PMN has a low-T regime which exhibits not only the generic and nearly ubiquitous '1/f' distribution of long relaxation times, but also a specific (wtA)-T scaling relation found for aging in spin glasses and expected for some hierarchical glassy kinetics models.

Original languageEnglish (US)
Pages (from-to)3033-3036
Number of pages4
JournalPhysical review letters
Issue number14
StatePublished - Oct 2 2000
Externally publishedYes

ASJC Scopus subject areas

  • General Physics and Astronomy


Dive into the research topics of 'Aging in a relaxor ferroelectric: scaling and memory effects'. Together they form a unique fingerprint.

Cite this