Advances in unit testing: Theory and practice

Tao Xie, Nikolai Tillmann, Pratap Lakshman

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Parameterized unit testing, recent advances in unit testing, is a new methodology extending the previous industry practice based on traditional unit tests without parameters. A parameterized unit test (PUT) is simply a test method that takes parameters, calls the code under test, and states assertions. Parameterized unit testing allows the separation of two testing concerns or tasks: the specification of external, black-box behavior (i.e., assertions or specifications) by developers and the generation and selection of internal, white-box test inputs (i.e., high-code-covering test inputs) by tools. PUTs have been supported by various testing frameworks. Various open source and industrial testing tools also exist to generate test inputs for PUTs. This technical briefing presents latest research on principles and techniques, as well as practical considerations to apply parameterized unit testing on real-world programs, highlighting success stories, research and education achievements, and future research directions in developer testing.

Original languageEnglish (US)
Title of host publicationProceedings - 5th International Workshop on Green and Sustainable Software, GREENS 2016
PublisherIEEE Computer Society
Number of pages2
ISBN (Electronic)9781450341615, 9781450342056
StatePublished - May 14 2016
Event2016 IEEE/ACM 38th IEEE International Conference on Software Engineering, ICSE 2016 - Austin, United States
Duration: May 14 2016May 22 2016

Publication series

NameProceedings - International Conference on Software Engineering
ISSN (Print)0270-5257


Other2016 IEEE/ACM 38th IEEE International Conference on Software Engineering, ICSE 2016
Country/TerritoryUnited States


  • Parameterized unit testing
  • Test generation
  • Test oracles

ASJC Scopus subject areas

  • Software


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