Advancements, limitations and challenges in hyperspectral imaging for comprehensive assessment of wheat quality: An up-to-date review

The potential of hyperspectral imaging technology (HIT) for the determination of physicochemical and nutritional components, evaluation of fungal/mycotoxins contamination, wheat varieties classification, identification of non-mildew-damaged wheat kernels, as well as detection of flour adulteration is comprehensively illustrated and reviewed. The latest findings (2018–2023) of HIT in wheat quality evaluation through internal and external attributes are compared and summarized in detail. The limitations and challenges of HIT to improve assessment accuracy are clearly described. Additionally, various practical recommendations and strategies for the potential application of HIT are highlighted. The future trends and prospects of HIT in evaluating wheat quality are also mentioned. In conclusion, HIT stands as a cutting-edge technology with immense potential for revolutionizing wheat quality evaluation. As advancements in HIT continue, it will play a pivotal role in shaping the future of wheat quality assessment and contributing to a more sustainable and efficient food supply chain.