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Adhesion strength measurement of polymer dielectric interfaces using laser spallation technique
Soma Sekhar V. Kandula
, Cheryl D. Hartfield
,
Philippe H. Geubelle
,
Nancy R. Sottos
Aerospace Engineering
National Center for Supercomputing Applications (NCSA)
Mechanical Science and Engineering
Grainger College of Engineering
Beckman Institute for Advanced Science and Technology
Center for Advanced Study
Materials Science and Engineering
Materials Research Lab
Research output
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Article
›
peer-review
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Keyphrases
Adhesion Strength
100%
Polymer Dielectrics
100%
Strength Measurement
100%
Interface Adhesion Strength
100%
Dielectric Interface
100%
Laser Spallation
100%
Interface Strength
100%
Processing Conditions
50%
Wafer
50%
Stress Wave Propagation
50%
Silicon Nitride
50%
Substrate Surface
50%
Surface Morphology
50%
Laser-induced
50%
Surface Roughness
50%
Spallation
50%
Poly(p-phenylene benzobisoxazole)
50%
Critical Interface
50%
Value Correlate
50%
Multilayered Materials
50%
Autoclave
50%
Engineering
Dielectrics
100%
Interface Strength
100%
Nitride
50%
Processing Condition
50%
Surface Morphology
50%
Substrate Surface
50%
Stress Wave
50%
Material Science
Bond Strength (Materials)
100%
Dielectric Material
100%
Silicon
33%
Surface Morphology
33%
Surface Roughness
33%
Silicon Nitride
33%
Multilayered Material
33%