Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging

James Tschanz, Nam Sung Kim, Saurabh Dighe, Jason Howard, Gregory Ruhl, Sriram Vangal, Siva Narendra, Yatin Hoskote, Howard Wilson, Carol Lam, Matthew Shuman, Carlos Tokunaga, Dinesh Somasekhar, Stephen Tang, David Finan, Tanay Karnik, Nitin Borkar, Nasser Kurd, Vivek De

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Temperature, voltage, and current sensors monitor the operation of a TCP/IP offload accelerator engine fabricated in 90nm CMOS, and a control unit dynamically changes frequency, voltage, and body bias for optimum performance and energy efficiency. Fast response to droops and temperature changes is enabled by a multi-PLL clocking unit and on-chip body bias. Adaptive techniques are also used to compensate performance degradation due to device aging, reducing the aging guardband.

Original languageEnglish (US)
Title of host publication2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers
DOIs
StatePublished - Sep 27 2007
Event54th IEEE International Solid-State Circuits Conference, ISSCC 2007 - San Francisco, CA, United States
Duration: Feb 11 2007Feb 15 2007

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
ISSN (Print)0193-6530

Other

Other54th IEEE International Solid-State Circuits Conference, ISSCC 2007
CountryUnited States
CitySan Francisco, CA
Period2/11/072/15/07

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Tschanz, J., Kim, N. S., Dighe, S., Howard, J., Ruhl, G., Vangal, S., Narendra, S., Hoskote, Y., Wilson, H., Lam, C., Shuman, M., Tokunaga, C., Somasekhar, D., Tang, S., Finan, D., Karnik, T., Borkar, N., Kurd, N., & De, V. (2007). Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging. In 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers [4242380] (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). https://doi.org/10.1109/ISSCC.2007.373409