Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging

James Tschanz; Nam Sung Kim; Saurabh Dighe; Jason Howard; Gregory Ruhl; Sriram Vangal; Siva Narendra; Yatin Hoskote; Howard Wilson; Carol Lam; Matthew Shuman; Carlos Tokunaga; Dinesh Somasekhar; Stephen Tang; David Finan; Tanay Karnik; Nitin Borkar; Nasser Kurd; Vivek De

doi:10.1109/ISSCC.2007.373409

Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging

James Tschanz, Nam Sung Kim, Saurabh Dighe, Jason Howard, Gregory Ruhl, Sriram Vangal, Siva Narendra, Yatin Hoskote, Howard Wilson, Carol Lam, Matthew Shuman, Carlos Tokunaga, Dinesh Somasekhar, Stephen Tang, David Finan, Tanay Karnik, Nitin Borkar, Nasser Kurd, Vivek De

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Temperature, voltage, and current sensors monitor the operation of a TCP/IP offload accelerator engine fabricated in 90nm CMOS, and a control unit dynamically changes frequency, voltage, and body bias for optimum performance and energy efficiency. Fast response to droops and temperature changes is enabled by a multi-PLL clocking unit and on-chip body bias. Adaptive techniques are also used to compensate performance degradation due to device aging, reducing the aging guardband.

Original language	English (US)
Title of host publication	2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	292-294
Number of pages	3
ISBN (Print)	1424408539, 9781424408535
DOIs	https://doi.org/10.1109/ISSCC.2007.373409
State	Published - 2007
Externally published	Yes
Event	54th IEEE International Solid-State Circuits Conference, ISSCC 2007 - San Francisco, CA, United States Duration: Feb 11 2007 → Feb 15 2007

Publication series

Name	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
ISSN (Print)	0193-6530

Other

Other	54th IEEE International Solid-State Circuits Conference, ISSCC 2007
Country	United States
City	San Francisco, CA
Period	2/11/07 → 2/15/07

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/ISSCC.2007.373409

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Tschanz, J., Kim, N. S., Dighe, S., Howard, J., Ruhl, G., Vangal, S., Narendra, S., Hoskote, Y., Wilson, H., Lam, C., Shuman, M., Tokunaga, C., Somasekhar, D., Tang, S., Finan, D., Karnik, T., Borkar, N., Kurd, N., & De, V. (2007). Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging. In 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers (pp. 292-294). [4242380] (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2007.373409

Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging. / Tschanz, James; Kim, Nam Sung; Dighe, Saurabh; Howard, Jason; Ruhl, Gregory; Vangal, Sriram; Narendra, Siva; Hoskote, Yatin; Wilson, Howard; Lam, Carol; Shuman, Matthew; Tokunaga, Carlos; Somasekhar, Dinesh; Tang, Stephen; Finan, David; Karnik, Tanay; Borkar, Nitin; Kurd, Nasser; De, Vivek.

2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., 2007. p. 292-294 4242380 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tschanz, J, Kim, NS, Dighe, S, Howard, J, Ruhl, G, Vangal, S, Narendra, S, Hoskote, Y, Wilson, H, Lam, C, Shuman, M, Tokunaga, C, Somasekhar, D, Tang, S, Finan, D, Karnik, T, Borkar, N, Kurd, N & De, V 2007, Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging. in 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers., 4242380, Digest of Technical Papers - IEEE International Solid-State Circuits Conference, Institute of Electrical and Electronics Engineers Inc., pp. 292-294, 54th IEEE International Solid-State Circuits Conference, ISSCC 2007, San Francisco, CA, United States, 2/11/07. https://doi.org/10.1109/ISSCC.2007.373409

Tschanz J, Kim NS, Dighe S, Howard J, Ruhl G, Vangal S et al. Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging. In 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc. 2007. p. 292-294. 4242380. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). https://doi.org/10.1109/ISSCC.2007.373409

Tschanz, James ; Kim, Nam Sung ; Dighe, Saurabh ; Howard, Jason ; Ruhl, Gregory ; Vangal, Sriram ; Narendra, Siva ; Hoskote, Yatin ; Wilson, Howard ; Lam, Carol ; Shuman, Matthew ; Tokunaga, Carlos ; Somasekhar, Dinesh ; Tang, Stephen ; Finan, David ; Karnik, Tanay ; Borkar, Nitin ; Kurd, Nasser ; De, Vivek. / Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging. 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., 2007. pp. 292-294 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

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abstract = "Temperature, voltage, and current sensors monitor the operation of a TCP/IP offload accelerator engine fabricated in 90nm CMOS, and a control unit dynamically changes frequency, voltage, and body bias for optimum performance and energy efficiency. Fast response to droops and temperature changes is enabled by a multi-PLL clocking unit and on-chip body bias. Adaptive techniques are also used to compensate performance degradation due to device aging, reducing the aging guardband.",

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Adaptive frequency and biasing techniques for tolerance to dynamic temperature-voltage variations and aging

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