TY - GEN
T1 - Adaptive angular sampling approach for emission tomography
AU - Li, Nan
AU - Meng, Ling Jian
PY - 2010
Y1 - 2010
N2 - This paper presents an adaptive angular sampling approach developed for SPECT systems that require the rotation of the detection system to obtain an adequate angular sampling. The basic idea of the approach is to assign different imaging times across possible sampling angles, based on the efficiency of the camera(s) at each possible angle for collecting imaging information. In this study, we used the resolution-variance tradeoffs and bias-variance tradeoffs as performance indices for guiding the adaptive angular sampling strategy, and applied a highly efficient computation scheme, based on the non-uniform object-space pixilation methods, for deriving the optimum time distribution in near real-time. This approach allows an optimum efficiency for collecting imaging information and therefore offers an improved image quality.
AB - This paper presents an adaptive angular sampling approach developed for SPECT systems that require the rotation of the detection system to obtain an adequate angular sampling. The basic idea of the approach is to assign different imaging times across possible sampling angles, based on the efficiency of the camera(s) at each possible angle for collecting imaging information. In this study, we used the resolution-variance tradeoffs and bias-variance tradeoffs as performance indices for guiding the adaptive angular sampling strategy, and applied a highly efficient computation scheme, based on the non-uniform object-space pixilation methods, for deriving the optimum time distribution in near real-time. This approach allows an optimum efficiency for collecting imaging information and therefore offers an improved image quality.
UR - http://www.scopus.com/inward/record.url?scp=79960303759&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79960303759&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2010.5874327
DO - 10.1109/NSSMIC.2010.5874327
M3 - Conference contribution
AN - SCOPUS:79960303759
SN - 9781424491063
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 2903
EP - 2909
BT - IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
T2 - 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Y2 - 30 October 2010 through 6 November 2010
ER -