Active Sampling for Closed-Loop Statistical Verification of Uncertain Nonlinear Systems

John F. Quindlen, Ufuk Topcu, Girish Chowdhary, Jonathan P. How

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Increasingly demanding performance requirements for dynamical systems motivate the adoption of nonlinear and adaptive control techniques. One challenge is the nonlinearity of the resulting closed-loop system complicates verification that the system does satisfy the requirements at all possible operating conditions. This paper presents a data-driven procedure for efficient simulation-based, statistical verification without the reliance upon exhaustive simulations. In contrast to previous work, this approach introduces a method for online estimation of prediction accuracy without the use of external validation sets. This work also develops a novel active sampling algorithm that iteratively selects additional training points in order to maximize the accuracy of the predictions while still limited to a sample budget. Three case studies demonstrate the utility of the new approach and the results show up to a 50% improvement over state-of-the-art techniques.

Original languageEnglish (US)
Title of host publication2018 Annual American Control Conference, ACC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages6259-6265
Number of pages7
ISBN (Print)9781538654286
DOIs
StatePublished - Aug 9 2018
Event2018 Annual American Control Conference, ACC 2018 - Milwauke, United States
Duration: Jun 27 2018Jun 29 2018

Publication series

NameProceedings of the American Control Conference
Volume2018-June
ISSN (Print)0743-1619

Other

Other2018 Annual American Control Conference, ACC 2018
CountryUnited States
CityMilwauke
Period6/27/186/29/18

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Quindlen, J. F., Topcu, U., Chowdhary, G., & How, J. P. (2018). Active Sampling for Closed-Loop Statistical Verification of Uncertain Nonlinear Systems. In 2018 Annual American Control Conference, ACC 2018 (pp. 6259-6265). [8431662] (Proceedings of the American Control Conference; Vol. 2018-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/ACC.2018.8431662