Active hot spot cooling of GaN transistors with electric field enhanced jumping droplet condensation

Thomas Foulkes, Junho Oh, Patrick Birbarah, Jason Neely, Nenad Miljkovic, Robert C.N. Pilawa-Podgurski

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Mitigating heat generated by hot spots inside of power electronic devices is a formidable obstacle to further increases in power density. This paper presents the first demonstration of active cooling for hot spots via jumping droplet condensation. This newly discovered phase change cooling mechanism comprises 10 to 100 μm sized droplets leaping from a cold superhydrophobic surface onto a hot GaN transistor and efficiently transferring heat via evaporation. After discussing how electric fields can enhance this process, observations from cooling GaN transistors with this method are outlined. Experimental measurements demonstrate increased cooling rates and steerable heat transfer through the application of electric fields.

Original languageEnglish (US)
Title of host publication2017 IEEE Applied Power Electronics Conference and Exposition, APEC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages912-918
Number of pages7
ISBN (Electronic)9781509053667
DOIs
StatePublished - May 17 2017
Event32nd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2017 - Tampa, United States
Duration: Mar 26 2017Mar 30 2017

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Other

Other32nd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2017
Country/TerritoryUnited States
CityTampa
Period3/26/173/30/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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