Accurate wide-band de-embedding of port discontinuities in full-wave models of multi-port integrated circuits

V. I. Okhmatovski, J. Morsey, Andreas C Cangellaris

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper extends the idea of short-open calibration (SOC) to de-embed the parasitic port discontinuities in full-wave modeling of multi-port integrated circuits. Treatment of the multi-ports is made possible through the vector implementation of the original scalar SOC technique suitable for the single or double port circuits. It is demonstrated that the introduction of the PEC walls as a part of the δ-gap generators in the original method is redundant and unnecessary complications due to their presence can be avoided.

Original languageEnglish (US)
Title of host publicationAnnual Review of Progress in Applied Computational Electromagnetics
Pages468-471
Number of pages4
StatePublished - 2003
Event19th Annual Review of Progress in Applied Computational Electromagnetics - Monterey, CA, United States
Duration: Mar 24 2003Mar 28 2003

Other

Other19th Annual Review of Progress in Applied Computational Electromagnetics
CountryUnited States
CityMonterey, CA
Period3/24/033/28/03

Keywords

  • De-embedding
  • Full-wave CAD
  • Method of moments
  • Multi-port
  • Short-open calibration

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Okhmatovski, V. I., Morsey, J., & Cangellaris, A. C. (2003). Accurate wide-band de-embedding of port discontinuities in full-wave models of multi-port integrated circuits. In Annual Review of Progress in Applied Computational Electromagnetics (pp. 468-471)