Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction

Research output: Contribution to journalArticlepeer-review

Abstract

The method for accurate structure refinement from energy-filtered convergent-beam electron diffraction (CBED) patterns is described with emphasis on recent progress in using imaging filters and 2-D detectors. Details are given about the underlying theoretical model and the statistical analysis of experimental data. The relationship between crystal potential and charge density is also derived for crystals at thermal equilibrium. The method is applied to the refinement of Si (111) and (222) structure factors using various goodness-of-fit (GOF) criteria. Results show that the refinement method is robust and highly accurate. The importance of the experimentally measured structure factors is illustrated through the study of the charge density in MgO. With the measured structure factors, it is possible to obtain details about the charge redistribution due to crystal bonding.

Original languageEnglish (US)
Pages (from-to)220-233
Number of pages14
JournalMicroscopy research and technique
Volume46
Issue number3
DOIs
StatePublished - Aug 1 1999
Externally publishedYes

Keywords

  • 2-D detectors
  • Energy filtering
  • Imaging filter
  • Structure factor

ASJC Scopus subject areas

  • Agricultural and Biological Sciences(all)
  • Anatomy
  • Instrumentation

Fingerprint

Dive into the research topics of 'Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction'. Together they form a unique fingerprint.

Cite this