Accurate recovery of a specularity from a few samples of the reflectance function

Gilles Baechler, Ivan Dokmanic, Loic Baboulaz, Martin Vetterli

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a new technique for estimating the specular peak of the bidirectional reflectance distribution function (BRDF) based on finite rate of innovation (FRI) sampling. The specular component of the BRDF varies rapidly, so it is challenging to acquire it by point-wise sampling. Yet, the knowledge of its precise location is key to render realistically complex materials. We show how to adapt the FRI framework to accurately determine the location of a single pulse when the sampling kernel is unknown. We use this result to determine the position of the specularity, and then estimate its shape by non-linear optimization. We demonstrate the feasibility of our approach in simulations and via a practical experiment using a custom-built BRDF acquisition device.

Original languageEnglish (US)
Title of host publication2016 IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1596-1600
Number of pages5
ISBN (Electronic)9781479999880
DOIs
StatePublished - May 18 2016
Event41st IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2016 - Shanghai, China
Duration: Mar 20 2016Mar 25 2016

Publication series

NameICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedings
Volume2016-May
ISSN (Print)1520-6149

Other

Other41st IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2016
Country/TerritoryChina
CityShanghai
Period3/20/163/25/16

Keywords

  • Bidirectional Reflectance Distribution Function
  • Finite Rate of Innovation
  • Sampling
  • Specularity

ASJC Scopus subject areas

  • Software
  • Signal Processing
  • Electrical and Electronic Engineering

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