Accurate measurements of crystal structure factors using a FEG electron microscope

G. Ren, J. M. Zuo, L. M. Peng

Research output: Contribution to journalArticlepeer-review

Abstract

An experimental procedure for the accurate measurement of crystal structure factors is described. This procedure is based on the use of a field emission gun electron microscope equipped with a Gatan Imaging Filter (GIF) system. The slow-scan CCD camera of the GIF system is first characterized and a constrained least squares restoration scheme is used for the deconvolution of the experimentally recorded raw elastic CBED patterns. The procedure has been applied for the accurate measurement of the (111) and (222) structure factors of silicon single crystal. A residual χ2 value of 2.87 is achieved and the determined structure factors agree well with previous measurements using X-ray and electron diffraction techniques.

Original languageEnglish (US)
Pages (from-to)459-467
Number of pages9
JournalMicron
Volume28
Issue number6
DOIs
StatePublished - Dec 1 1997
Externally publishedYes

Keywords

  • CBED
  • Dynamical electron diffraction
  • FEG
  • GIF
  • Structure factors

ASJC Scopus subject areas

  • Cell Biology
  • Materials Science(all)
  • Instrumentation

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