Accurate measurement of atomic beam flux by pseudo-double-beam atomic absorption spectroscopy for growth of thin-film oxide superconductors

M. E. Klausmeier-Brown, J. N. Eckstein, I. Bozovic, G. F. Virshup

Research output: Contribution to journalArticlepeer-review

Abstract

We report the use of pseudo-double-beam atomic absorption spectroscopy to make very accurate (0.1%-1%) measurements of the beam flux from Knudsen effusion cells in a molecular beam epitaxy system. This system has been used to grow Bi-Sr-Ca-Cu-O-based superconducting thin films and heterostructures in an atomic-layer-by-layer fashion. The resulting material displays excellent crystallographic and transport properties. Atomic absorption measurement of beam fluxes may also be of benefit for other materials systems, such as InGaAs/InP.

Original languageEnglish (US)
Pages (from-to)657-659
Number of pages3
JournalApplied Physics Letters
Volume60
Issue number5
DOIs
StatePublished - Dec 1 1992
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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