Accurate estimation of SRAM dynamic stability

Diaaeldin Khalil, Muhammad Khellah, Nam Sung Kim, Yehea Ismail, Tanay Karnik, K. De Vivek

Research output: Contribution to journalArticle

Abstract

In this paper, an accurate approach for estimating SRAM dynamic stability is proposed. The conventional methods of SRAM stability estimation suffer from two major drawbacks: 1) using static failure criteria, such as static noise margin (SNM), which does not capture the transient and dynamic behavior of SRAM operation and 2) using quasi-Monte Carlo simulation, which approximates the failure distribution, resulting in large errors at the tails where the desired failure probabilities exist. These drawbacks are eliminated by employing a new distribution-independent, most-probable-failure-point search technique for accurate probability calculation along with accurate simulation-based dynamic failure criteria. Compared to previously published techniques, the proposed technique offers orders of magnitude improvement in accuracy. Furthermore, the proposed technique enables the correct evaluation of stability in real operation conditions and for different dynamic circuit techniques, such as dynamic write-back, where the conventional methods are not applicable.

Original languageEnglish (US)
Article number4668629
Pages (from-to)1639-1647
Number of pages9
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume16
Issue number12
DOIs
StatePublished - Dec 1 2008

Keywords

  • Circuit stability
  • Process variations
  • Random dopant fluctuation (RDF)
  • SRAM
  • Yield estimation

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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