Accurate diode forward and reverse recovery model using asymptotic waveform evaluation techniques

Wendemagegnehu T. Beyene, Jose E. Schutt-Aine

Research output: Contribution to journalConference article

Abstract

An accurate simulation of diode forward and reverse recovery phenomena using AWE is presented. Moment-matching technique is applied directly to the drift-diffusion equation to construct a reduced-order model that describes the dynamic process occurring in a p-n junction. The model provides an increasingly accurate approximation to the characteristics of the device under all operating conditions. It simulates accurately the diode transient behavior and high frequency characteristics in power electronic simulation. The p-n diode recovery phenomenon is simulated, and the improved accuracy is verified by comparisons with SPICE simulations.

Original languageEnglish (US)
Pages (from-to)625-628
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume1
StatePublished - Jan 1 1996
EventProceedings of the 1996 IEEE International Symposium on Circuits and Systems, ISCAS. Part 1 (of 4) - Atlanta, GA, USA
Duration: May 12 1996May 15 1996

Fingerprint

Diodes
Recovery
SPICE
Power electronics

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Accurate diode forward and reverse recovery model using asymptotic waveform evaluation techniques. / Beyene, Wendemagegnehu T.; Schutt-Aine, Jose E.

In: Proceedings - IEEE International Symposium on Circuits and Systems, Vol. 1, 01.01.1996, p. 625-628.

Research output: Contribution to journalConference article

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