Accuracy Preserving Extensions to a PDK MOSFET Model for ESD Simulation

Yujie Zhou, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work demonstrates a Verilog-A model that may be interconnected to a PDK MOSFET model; the composite model is valid at ESD current levels while retaining the accuracy of the PDK model for ac, dc, and transient simulation at current levels reflective of normal operating conditions. The model's accuracy under ESD conditions is verified by comparing simulation results to TLP and VF-TLP measurement data.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2024, EOS/ESD 2024
PublisherESD Association
ISBN (Electronic)9781585373536
DOIs
StatePublished - 2024
Externally publishedYes
Event46th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2024 - Reno, United States
Duration: Sep 16 2024Sep 18 2024

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Conference

Conference46th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2024
Country/TerritoryUnited States
CityReno
Period9/16/249/18/24

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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