TY - GEN
T1 - Accuracy Preserving Extensions to a PDK MOSFET Model for ESD Simulation
AU - Zhou, Yujie
AU - Rosenbaum, Elyse
N1 - Publisher Copyright:
© 2024 ESD Association. All rights reserved.
PY - 2024
Y1 - 2024
N2 - This work demonstrates a Verilog-A model that may be interconnected to a PDK MOSFET model; the composite model is valid at ESD current levels while retaining the accuracy of the PDK model for ac, dc, and transient simulation at current levels reflective of normal operating conditions. The model's accuracy under ESD conditions is verified by comparing simulation results to TLP and VF-TLP measurement data.
AB - This work demonstrates a Verilog-A model that may be interconnected to a PDK MOSFET model; the composite model is valid at ESD current levels while retaining the accuracy of the PDK model for ac, dc, and transient simulation at current levels reflective of normal operating conditions. The model's accuracy under ESD conditions is verified by comparing simulation results to TLP and VF-TLP measurement data.
UR - http://www.scopus.com/inward/record.url?scp=85208439216&partnerID=8YFLogxK
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U2 - 10.23919/EOS/ESD61719.2024.10702120
DO - 10.23919/EOS/ESD61719.2024.10702120
M3 - Conference contribution
AN - SCOPUS:85208439216
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2024, EOS/ESD 2024
PB - ESD Association
T2 - 46th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2024
Y2 - 16 September 2024 through 18 September 2024
ER -