TY - JOUR
T1 - A Voltage Vector Residual Estimation Method Based on Current Path Tracking for T-Type Inverter Open-Circuit Fault Diagnosis
AU - Wang, Borong
AU - Li, Zhan
AU - Bai, Zhihong
AU - Krein, Philip T.
AU - Ma, Hao
N1 - Funding Information:
Manuscript received October 24, 2020; revised February 16, 2021 and April 24, 2021; accepted May 29, 2021. Date of publication June 8, 2021; date of current version August 16, 2021. This work was supported in part by the National Natural Science Foundation of China under Grant 52061635101 and in part by the Zhejiang University/University of Illinois at Urbana-Champaign Institute. Recommended for publication by Associate Editor A. J. Marques Cardoso. (Zhihong Bai, Hao Ma, and Philip T. Krein were principal supervisors.) (Corresponding author: Hao Ma.) Borong Wang and Hao Ma are with the College of Electrical Engineering, Zhejiang University, Hangzhou 310027, China, and also with the Zhejiang University/University of Illinois at Urbana-Champaign Institute, Haining 314400, China (e-mail: borongw@126.com; mahao@zju.edu.cn).
Publisher Copyright:
© 1986-2012 IEEE.
PY - 2021/12
Y1 - 2021/12
N2 - This article proposes a current path tracking approach that uses a current path state to correlate device status and operating mode of an inverter under normal and abnormal conditions. Based on graph theory, a node-path modeling method is proposed and applied in the T-type inverter topologies. The model reflects system state transitions, given healthy or faulted transistors. Effective conduction paths and node potentials can be derived with the model to indicate circuit faults. In addition, a hierarchical diagnosis method is proposed for single-transistor open-circuit (OC) faults based on estimated output voltage vectors. The diagnosis involves two steps. First, an OC fault can be detected by following a residual between an actual voltage vector and its reference voltage vector calculated from duty ratios of intended current paths. Next, faulty transistors sharing similar features can be distinguished by adopting a current path state reconfiguration approach. Diagnosis variables can be obtained from the controller, and their errors, because of sampling, signal delay, and dead time, are taken into account to avoid misdiagnosis. Experimental results verify the robustness and effectiveness of the proposed method.
AB - This article proposes a current path tracking approach that uses a current path state to correlate device status and operating mode of an inverter under normal and abnormal conditions. Based on graph theory, a node-path modeling method is proposed and applied in the T-type inverter topologies. The model reflects system state transitions, given healthy or faulted transistors. Effective conduction paths and node potentials can be derived with the model to indicate circuit faults. In addition, a hierarchical diagnosis method is proposed for single-transistor open-circuit (OC) faults based on estimated output voltage vectors. The diagnosis involves two steps. First, an OC fault can be detected by following a residual between an actual voltage vector and its reference voltage vector calculated from duty ratios of intended current paths. Next, faulty transistors sharing similar features can be distinguished by adopting a current path state reconfiguration approach. Diagnosis variables can be obtained from the controller, and their errors, because of sampling, signal delay, and dead time, are taken into account to avoid misdiagnosis. Experimental results verify the robustness and effectiveness of the proposed method.
KW - Current path tracking
KW - T-type inverters
KW - graph theory
KW - open-circuit (OC) fault diagnosis
KW - postfault reconfiguration
UR - http://www.scopus.com/inward/record.url?scp=85111045726&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85111045726&partnerID=8YFLogxK
U2 - 10.1109/TPEL.2021.3087488
DO - 10.1109/TPEL.2021.3087488
M3 - Article
AN - SCOPUS:85111045726
VL - 36
SP - 13460
EP - 13477
JO - IEEE Transactions on Power Electronics
JF - IEEE Transactions on Power Electronics
SN - 0885-8993
IS - 12
M1 - 9448412
ER -