TY - GEN
T1 - A viral model of product adoption with antagonistic interactions
AU - Ruf, Sebastian F.
AU - Pare, Philip E.
AU - Liu, Ji
AU - Beck, Carolyn L.
AU - Basar, Tamer
N1 - S.F. Ruf is with the Center for Complex Networks Research at North-eastern University ([email protected]). P.E. Paré, C.L. Beck, and T. Bas¸ar are with the Coordinated Science Laboratory at the University of Illinois at Urbana-Champaign ([email protected], [email protected], [email protected]). J. Liu is with the Department of Electrical and Computer Engineering at Stony Brook University ([email protected]). This material is based on research partially sponsored by the National Science Foundation, grants CPS 1544953 and ECCS 1509302.
PY - 2019/7
Y1 - 2019/7
N2 - In this paper, we extend a viral model for product adoption which takes into account how an agent's (or subpop-ulation's) opinion affects the decision to adopt a product or not. Here the coupled adoption opinion model considers the case where the opinion dynamic evolves over a signed network, which captures antagonistic interactions between agents. These signed networks capture a more realistic class of opinion behaviors and lead to a rich set of adoption behaviors for the coupled model. The equilibria of this model are characterized and some stability properties of these equilibria are discussed. Further behavior of the coupled model is studied via simulation.
AB - In this paper, we extend a viral model for product adoption which takes into account how an agent's (or subpop-ulation's) opinion affects the decision to adopt a product or not. Here the coupled adoption opinion model considers the case where the opinion dynamic evolves over a signed network, which captures antagonistic interactions between agents. These signed networks capture a more realistic class of opinion behaviors and lead to a rich set of adoption behaviors for the coupled model. The equilibria of this model are characterized and some stability properties of these equilibria are discussed. Further behavior of the coupled model is studied via simulation.
UR - http://www.scopus.com/inward/record.url?scp=85072296983&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85072296983&partnerID=8YFLogxK
U2 - 10.23919/acc.2019.8815349
DO - 10.23919/acc.2019.8815349
M3 - Conference contribution
AN - SCOPUS:85072296983
T3 - Proceedings of the American Control Conference
SP - 3382
EP - 3387
BT - 2019 American Control Conference, ACC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 American Control Conference, ACC 2019
Y2 - 10 July 2019 through 12 July 2019
ER -