A technique, utilizing transmission electron microscopy, is described that enables the modeling and diffraction simulation of structural development during the processing of gelderived products. This technique relies on the determination of the position and relative intensity of diffuse electron diffraction rings from small domains. X‐ray diffraction cannot provide a basis for this analysis. A qualitative microcrystal modeling of the structural changes accompanying the in situ transformation of a zirconia‐precursor gel to crystalline ZrO2 is described. A quantitative analysis is possible only after correction for the inelastic diffraction effect and a calibration of the nonlinear response of the photographic film.
|Original language||English (US)|
|Number of pages||8|
|Journal||Journal of the American Ceramic Society|
|State||Published - Apr 1993|
ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry