A technique to measure the dynamic response of a-Si:H thin film transistor circuits

Rashid Bashir, Gerold W. Neudeck

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)973-974
Number of pages2
JournalSolid State Electronics
Volume33
Issue number7
DOIs
StatePublished - Jul 1990
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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