A technique to measure the dynamic response of a-Si:H thin film transistor circuits

Rashid Bashir; Gerold W. Neudeck

doi:10.1016/0038-1101(90)90082-P

A technique to measure the dynamic response of a-Si:H thin film transistor circuits

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	973-974
Number of pages	2
Journal	Solid State Electronics
Volume	33
Issue number	7
DOIs	https://doi.org/10.1016/0038-1101(90)90082-P
State	Published - Jul 1990
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Materials Chemistry
Electrical and Electronic Engineering

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10.1016/0038-1101(90)90082-P

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title = "A technique to measure the dynamic response of a-Si:H thin film transistor circuits",

author = "Rashid Bashir and Neudeck, {Gerold W.}",

year = "1990",

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doi = "10.1016/0038-1101(90)90082-P",

language = "English (US)",

volume = "33",

pages = "973--974",

journal = "Solid State Electronics",

issn = "0038-1101",

publisher = "Elsevier Ltd",

number = "7",

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AU - Neudeck, Gerold W.

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M3 - Article

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SN - 0038-1101

VL - 33

SP - 973

EP - 974

JO - Solid State Electronics

JF - Solid State Electronics

IS - 7

ER -

A technique to measure the dynamic response of a-Si:H thin film transistor circuits

ASJC Scopus subject areas

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