Dielectric spectroscopy was applied for the first time to nanometer-thin films within a SFA. Focus was on confinement-induced changes of dielectric response. The resultant data were analyzed in detail.
|Original language||English (US)|
|Number of pages||8|
|Journal||Journal of Chemical Physics|
|State||Published - Jul 1 2003|
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry