A surface forces platform for dielectric measurements

Yoon Kyoung Cho, Steve Granick

Research output: Contribution to journalArticle

Abstract

Dielectric spectroscopy was applied for the first time to nanometer-thin films within a SFA. Focus was on confinement-induced changes of dielectric response. The resultant data were analyzed in detail.

Original languageEnglish (US)
Pages (from-to)547-554
Number of pages8
JournalJournal of Chemical Physics
Volume119
Issue number1
DOIs
StatePublished - Jul 1 2003

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Fingerprint Dive into the research topics of 'A surface forces platform for dielectric measurements'. Together they form a unique fingerprint.

  • Cite this