Abstract
Dielectric spectroscopy was applied for the first time to nanometer-thin films within a SFA. Focus was on confinement-induced changes of dielectric response. The resultant data were analyzed in detail.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 547-554 |
| Number of pages | 8 |
| Journal | Journal of Chemical Physics |
| Volume | 119 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jul 1 2003 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry