A study of conductor modeling using the surface integral equation

Tian Xia, Hui Gan, Michael Wei, Weng Cho Chew

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A rigorous method to solve conductor problems using the surface integral equation is introduced. This formulation is based on the augmented electric field integral equation. In order to model conductors and accurately capture the losses, some integration techniques are analyzed and compared. The line integral method will be an optimal option for conductor problems. After incorporating this technique, this method can be applied to interconnect and packaging problems.

Original languageEnglish (US)
Title of host publication2015 IEEE 24th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages131-134
Number of pages4
ISBN (Electronic)9781479936410
DOIs
StatePublished - Dec 3 2015
Event24th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2015 - San Jose, United States
Duration: Oct 25 2015Oct 28 2015

Publication series

Name2015 IEEE 24th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2015

Other

Other24th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2015
Country/TerritoryUnited States
CitySan Jose
Period10/25/1510/28/15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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