A SPICE model of flexible transition metal dichalcogenide field-effect transistors

Ying Yu Chen, Zelei Sun, Deming Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the first SPICE model of the transition metal dichalcogenide (TMD) field-effect transistor (FET), which is a promising candidate for flexible electronics. The model supports different transistor design parameters such as width, length, oxide thickness, and various channel materials (MoS2, WSe2, etc.), as well as the applied strain, which enables the evaluation of transistor- and circuit-level behavior under process variation and different levels of bending. We performed SPICE simulations on digital logic gates to explore the design space of both MoS2- and WSe2-based transistors, and to evaluate the projected performance of these circuits under applied strain. Our simulations show that WSe2 circuits outperform MoS2 and Si-based CMOS in terms of energy-delay product (EDP) by up to 1 order of magnitude, depending on applications. Finally, we investigate TMDFET's behavior under process variation.

Original languageEnglish (US)
Title of host publication2015 52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781450335201
DOIs
StatePublished - Jul 24 2015
Event52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015 - San Francisco, United States
Duration: Jun 7 2015Jun 11 2015

Publication series

NameProceedings - Design Automation Conference
Volume2015-July
ISSN (Print)0738-100X

Other

Other52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015
Country/TerritoryUnited States
CitySan Francisco
Period6/7/156/11/15

Keywords

  • MoS
  • SPICE
  • TMDFET
  • WSe
  • compact modeling
  • exible electronics
  • process variation
  • simulation

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

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