TY - GEN
T1 - A SPICE-compatible model of graphene nano-ribbon field-effect transistors enabling circuit-level delay and power analysis under process variation
AU - Chen, Ying Yu
AU - Rogachev, Artem
AU - Sangai, Amit
AU - Iannaccone, Giuseppe
AU - Fiori, Gianluca
AU - Chen, Deming
PY - 2013
Y1 - 2013
N2 - This paper presents the first parameterized, SPICE-compatible compact model of a Graphene Nano-Ribbon Field-Effect Transistor (GNRFET) with doped reservoirs that also supports process variation. The current and charge models closely match numerical TCAD simulations. In addition, process variation in transistor dimension, edge roughness, and doping level in the reservoir are accurately modeled. Our model provides a means to analyze delay and power of graphene-based circuits under process variation, and offers design and fabrication insights for graphene circuits in the future. We show that edge roughness severely degrades the advantages of GNRFET circuits; however, GNRFET is still a good candidate for low-power applications.
AB - This paper presents the first parameterized, SPICE-compatible compact model of a Graphene Nano-Ribbon Field-Effect Transistor (GNRFET) with doped reservoirs that also supports process variation. The current and charge models closely match numerical TCAD simulations. In addition, process variation in transistor dimension, edge roughness, and doping level in the reservoir are accurately modeled. Our model provides a means to analyze delay and power of graphene-based circuits under process variation, and offers design and fabrication insights for graphene circuits in the future. We show that edge roughness severely degrades the advantages of GNRFET circuits; however, GNRFET is still a good candidate for low-power applications.
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U2 - 10.7873/date.2013.359
DO - 10.7873/date.2013.359
M3 - Conference contribution
AN - SCOPUS:84885597168
SN - 9783981537000
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1789
EP - 1794
BT - Proceedings - Design, Automation and Test in Europe, DATE 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013
Y2 - 18 March 2013 through 22 March 2013
ER -