A Soft Error Rate Analysis (SERA) methodology

Ming Zhang, Naresh R. Shanbhag

Research output: Contribution to journalConference article

Abstract

We present a soft error rate analysis (SERA) methodology for combinational and memory circuits. SERA is based on a modeling and analysis-based approach that employs a judicious mix of probability theory, circuit simulation, graph theory and fault simulation. SERA achieves five orders of magnitude speed-up over Monte Carlo based simulation approaches with less than 5% error. Dependence of soft error rate (SER) of combinational circuits on supply voltage, clock period, latching window, circuit topology, and input vector values are explicitly captured and studied for a typical 0.18 μm CMOS process. Results show that the SER of logic is a much stronger function of timing parameters than the supply voltage. Also, an "SER peaking" phenomenon in multipliers is observed where the center bits have an SER that is orders of magnitude greater than that of LSBs and MSBs.

Original languageEnglish (US)
Article number2A.3
Pages (from-to)111-118
Number of pages8
JournalIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
StatePublished - 2004
EventICCAD-2004 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers - San Jose, CA, United States
Duration: Nov 7 2004Nov 11 2004

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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