A semiconductor bio-electrical platform with addressable thermal control circuits for accelerated bioassay development

T. T. Chen, C. H. Wen, J. C. Huang, Y. C. Peng, S. Liu, S. H. Su, L. H. Cheng, H. C. Lai, T. C. Liao, F. L. Lai, C. W. Cheng, C. K. Yang, J. H. Yang, Y. J. Hsieh, E. Salm, B. Reddy, F. Tsui, Y. S. Liu, R. Bashir, M. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A 0.18μm SOI-CMOS bioelectrical sensing technology is introduced. An SOC chip integrates biosensor pixel arrays, controllers and amplifiers is used to demonstrate the performance of this technology. The pixel size in the pixel arrays is 10μm × 10μm, including biosensor, temperature sensor and heaters. The chip demonstrates detections of hydrogen ion concentration, enzymatic reactions and DNA hybridization with PCR. Experimental results show close to Nernst limit of 59mV/pH in ion concentration detection, sub-millimolar resolutions with 99.9% linearity in urea, and 400mV surface potential change in DNA hybridization. The SOC chip has an addressable temperature control for each pixel with embedded thermal sensors. A thermal time constant of 35msec/K and sub-degree localized temperature control are achieved. Order of magnitude improvements over previously reported are seen in both detectable minimum sample liquid volume and thermal time constant for PCR. This is a good demonstration of semiconductor technology for multi-biomarkers detection for medical applications.

Original languageEnglish (US)
Title of host publication2014 IEEE International Electron Devices Meeting, IEDM 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages15.4.1-15.4.4
EditionFebruary
ISBN (Electronic)9781479980017
DOIs
StatePublished - Feb 20 2015
Event2014 60th IEEE International Electron Devices Meeting, IEDM 2014 - San Francisco, United States
Duration: Dec 15 2014Dec 17 2014

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
NumberFebruary
Volume2015-February
ISSN (Print)0163-1918

Other

Other2014 60th IEEE International Electron Devices Meeting, IEDM 2014
Country/TerritoryUnited States
CitySan Francisco
Period12/15/1412/17/14

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Materials Chemistry
  • Electrical and Electronic Engineering

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