A scanning tunneling microscope with a wide sampling range

K. W. Hipps, Glenn Fried, Dale Fried

Research output: Contribution to journalArticlepeer-review


Construction of a simple scanning tunneling microscope (STM) is described. This STM is suitable for atmospheric, controlled atmosphere, and high vacuum (but not UHV) work. This STM is especially well suited for determining surface topography on the 0.1 nm scale when images must be obtained over a wide sampling region (mm). Interchangeable piezo heads allow the STM to be used either for atomic resolution or for large (800×800 nm) area scans. Atomic resolution pictures of the graphite surface demonstrate that this design is suitable for use with structures smaller than 0.1 nm. An image of a thin film of Au, deposited on pyrex, is also presented.

Original languageEnglish (US)
Pages (from-to)1869-1873
Number of pages5
JournalReview of Scientific Instruments
Issue number7
StatePublished - 1990
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation


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