A scalable SCR compact model for ESD circuit simulation

James P. Di Sarro; Elyse Rosenbaum

doi:10.1109/TED.2010.2081674

A scalable SCR compact model for ESD circuit simulation

Research output: Contribution to journal › Article › peer-review

Abstract

A scalable compact model for SCR-based electrostatic discharge (ESD) protection devices is presented. This model captures the effect that layout spacing has on SCR characteristics, such as holding voltage and trigger current. The model also captures both the delayed turn-on of the SCR, which results in large voltage overshoots during fast rise-time ESD events and the charge removal mechanisms that underlie the turn-off transient. Bias and time dependences of SCR on-resistance are captured with a resistance model that accounts for self-heating.

Original language	English (US)
Article number	5610716
Pages (from-to)	3275-3286
Number of pages	12
Journal	IEEE Transactions on Electron Devices
Volume	57
Issue number	12
DOIs	https://doi.org/10.1109/TED.2010.2081674
State	Published - Dec 2010

Keywords

Compact modeling
electrostatic discharge (ESD)
silicon-controlled rectifier (SCR)

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Online availability

10.1109/TED.2010.2081674

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title = "A scalable SCR compact model for ESD circuit simulation",

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author = "{Di Sarro}, {James P.} and Elyse Rosenbaum",

note = "Funding Information: Manuscript received June 26, 2010; revised September 1, 2010; accepted September 11, 2010. Date of current version November 19, 2010. The work of J. P. Di Sarro was supported by the IBM Ph.D. Fellowship. The review of this paper was arranged by Editor V. R. Rao.",

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N2 - A scalable compact model for SCR-based electrostatic discharge (ESD) protection devices is presented. This model captures the effect that layout spacing has on SCR characteristics, such as holding voltage and trigger current. The model also captures both the delayed turn-on of the SCR, which results in large voltage overshoots during fast rise-time ESD events and the charge removal mechanisms that underlie the turn-off transient. Bias and time dependences of SCR on-resistance are captured with a resistance model that accounts for self-heating.

AB - A scalable compact model for SCR-based electrostatic discharge (ESD) protection devices is presented. This model captures the effect that layout spacing has on SCR characteristics, such as holding voltage and trigger current. The model also captures both the delayed turn-on of the SCR, which results in large voltage overshoots during fast rise-time ESD events and the charge removal mechanisms that underlie the turn-off transient. Bias and time dependences of SCR on-resistance are captured with a resistance model that accounts for self-heating.

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KW - silicon-controlled rectifier (SCR)

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A scalable SCR compact model for ESD circuit simulation

Abstract

Keywords

ASJC Scopus subject areas

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