A scalable SCR compact model for ESD circuit simulation

James P. Di Sarro, Elyse Rosenbaum

Research output: Contribution to journalArticle

Abstract

A scalable compact model for SCR-based electrostatic discharge (ESD) protection devices is presented. This model captures the effect that layout spacing has on SCR characteristics, such as holding voltage and trigger current. The model also captures both the delayed turn-on of the SCR, which results in large voltage overshoots during fast rise-time ESD events and the charge removal mechanisms that underlie the turn-off transient. Bias and time dependences of SCR on-resistance are captured with a resistance model that accounts for self-heating.

Original languageEnglish (US)
Article number5610716
Pages (from-to)3275-3286
Number of pages12
JournalIEEE Transactions on Electron Devices
Volume57
Issue number12
DOIs
StatePublished - Dec 1 2010

Keywords

  • Compact modeling
  • electrostatic discharge (ESD)
  • silicon-controlled rectifier (SCR)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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