A Rutherford backscattering study of diffusion in polymers

M. A. Selen; Jack R. Macdonald

doi:10.1016/0167-5087(83)91020-7

A Rutherford backscattering study of diffusion in polymers

M. A. Selen, Jack R. Macdonald

Research output: Contribution to journal › Article › peer-review

Abstract

Rutherford backscattering of 1.6 MeV ⁴He⁺ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10^-14 cm²/s 2.0 × 10^-11 cm²/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.

Original language	English (US)
Pages (from-to)	451-455
Number of pages	5
Journal	Nuclear Instruments and Methods In Physics Research
Volume	218
Issue number	1-3
DOIs	https://doi.org/10.1016/0167-5087(83)91020-7
State	Published - Dec 15 1983
Externally published	Yes

ASJC Scopus subject areas

Engineering(all)

Online availability

10.1016/0167-5087(83)91020-7

Library availability

Discover UIUC Full Text

Cite this

@article{fa2110eb4b7b4a0ba20626ff29a5e543,

title = "A Rutherford backscattering study of diffusion in polymers",

abstract = "Rutherford backscattering of 1.6 MeV 4He+ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10-14 cm2/s 2.0 × 10-11 cm2/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.",

author = "Selen, {M. A.} and Macdonald, {Jack R.}",

note = "Funding Information: This work is supported in part by the Natural Sciences and Engineering Research Council of Canada (NSERC). One of us (MS) is a grateful holder of an NSERC Postgraduate Scholarship. We express particular gratitude to Jack Y. Josefowicz for providing the polymer samples and for many valuable discussions and to his co-workers at Xerox Research Centre of Canada for their assistance. We appreciate the assistance of Mr R. Gingerich in the operation of the Van de Graaff.",

year = "1983",

month = dec,

day = "15",

doi = "10.1016/0167-5087(83)91020-7",

language = "English (US)",

volume = "218",

pages = "451--455",

journal = "Nuclear Instruments and Methods In Physics Research",

issn = "0167-5087",

publisher = "North-Holland Publ Co",

number = "1-3",

}

TY - JOUR

T1 - A Rutherford backscattering study of diffusion in polymers

AU - Selen, M. A.

AU - Macdonald, Jack R.

N1 - Funding Information: This work is supported in part by the Natural Sciences and Engineering Research Council of Canada (NSERC). One of us (MS) is a grateful holder of an NSERC Postgraduate Scholarship. We express particular gratitude to Jack Y. Josefowicz for providing the polymer samples and for many valuable discussions and to his co-workers at Xerox Research Centre of Canada for their assistance. We appreciate the assistance of Mr R. Gingerich in the operation of the Van de Graaff.

PY - 1983/12/15

Y1 - 1983/12/15

N2 - Rutherford backscattering of 1.6 MeV 4He+ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10-14 cm2/s 2.0 × 10-11 cm2/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.

AB - Rutherford backscattering of 1.6 MeV 4He+ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10-14 cm2/s 2.0 × 10-11 cm2/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.

UR - http://www.scopus.com/inward/record.url?scp=0020922119&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020922119&partnerID=8YFLogxK

U2 - 10.1016/0167-5087(83)91020-7

DO - 10.1016/0167-5087(83)91020-7

M3 - Article

AN - SCOPUS:0020922119

SN - 0167-5087

VL - 218

SP - 451

EP - 455

JO - Nuclear Instruments and Methods In Physics Research

JF - Nuclear Instruments and Methods In Physics Research

IS - 1-3

ER -

A Rutherford backscattering study of diffusion in polymers

Abstract

ASJC Scopus subject areas

Online availability

Library availability

Related links

Fingerprint

Cite this