Rutherford backscattering of 1.6 MeV 4He+ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10-14 cm2/s 2.0 × 10-11 cm2/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.
|Original language||English (US)|
|Number of pages||5|
|Journal||Nuclear Instruments and Methods In Physics Research|
|State||Published - Dec 15 1983|
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