Abstract
Rutherford backscattering of 1.6 MeV 4He+ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10-14 cm2/s 2.0 × 10-11 cm2/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.
Original language | English (US) |
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Pages (from-to) | 451-455 |
Number of pages | 5 |
Journal | Nuclear Instruments and Methods In Physics Research |
Volume | 218 |
Issue number | 1-3 |
DOIs | |
State | Published - Dec 15 1983 |
Externally published | Yes |
ASJC Scopus subject areas
- Engineering(all)