A Rutherford backscattering study of diffusion in polymers

M. A. Selen; Jack R. Macdonald

doi:10.1016/0167-5087(83)91020-7

A Rutherford backscattering study of diffusion in polymers

M. A. Selen, Jack R. Macdonald

Research output: Contribution to journal › Article › peer-review

Abstract

Rutherford backscattering of 1.6 MeV ⁴He⁺ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10^-14 cm²/s 2.0 × 10^-11 cm²/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.

Original language	English (US)
Pages (from-to)	451-455
Number of pages	5
Journal	Nuclear Instruments and Methods In Physics Research
Volume	218
Issue number	1-3
DOIs	https://doi.org/10.1016/0167-5087(83)91020-7
State	Published - Dec 15 1983
Externally published	Yes

ASJC Scopus subject areas

General Engineering

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10.1016/0167-5087(83)91020-7

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title = "A Rutherford backscattering study of diffusion in polymers",

abstract = "Rutherford backscattering of 1.6 MeV 4He+ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10-14 cm2/s 2.0 × 10-11 cm2/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.",

author = "Selen, {M. A.} and Macdonald, {Jack R.}",

note = "Funding Information: This work is supported in part by the Natural Sciences and Engineering Research Council of Canada (NSERC). One of us (MS) is a grateful holder of an NSERC Postgraduate Scholarship. We express particular gratitude to Jack Y. Josefowicz for providing the polymer samples and for many valuable discussions and to his co-workers at Xerox Research Centre of Canada for their assistance. We appreciate the assistance of Mr R. Gingerich in the operation of the Van de Graaff.",

year = "1983",

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doi = "10.1016/0167-5087(83)91020-7",

language = "English (US)",

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pages = "451--455",

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T1 - A Rutherford backscattering study of diffusion in polymers

AU - Selen, M. A.

AU - Macdonald, Jack R.

N1 - Funding Information: This work is supported in part by the Natural Sciences and Engineering Research Council of Canada (NSERC). One of us (MS) is a grateful holder of an NSERC Postgraduate Scholarship. We express particular gratitude to Jack Y. Josefowicz for providing the polymer samples and for many valuable discussions and to his co-workers at Xerox Research Centre of Canada for their assistance. We appreciate the assistance of Mr R. Gingerich in the operation of the Van de Graaff.

PY - 1983/12/15

Y1 - 1983/12/15

N2 - Rutherford backscattering of 1.6 MeV 4He+ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10-14 cm2/s 2.0 × 10-11 cm2/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.

AB - Rutherford backscattering of 1.6 MeV 4He+ ions has been used to study the diffusion of selenium through a polystyrene hexylmethacrylate copolymer film and into a Mylar substrate. The diffusion profiles exhibit a concentration-time dependence which is typical of extended source diffusion. The measured diffusion coefficients range 3.8 × 10-14 cm2/s 2.0 × 10-11 cm2/s and, in the case of diffusion into Mylar, are dependent upon selenium concentration. It is suggested that ion beam techniques can be applied to study diffusion in a variety of binary polymer systems.

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A Rutherford backscattering study of diffusion in polymers

Abstract

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