A robust control based solution to the sample-profile estimation problem in fast atomic force microscopy

Srinivasa M. Salapaka, Tathagata De, Abu Sebastian

Research output: Contribution to journalArticlepeer-review

Abstract

The atomic force microscope (AFM) is a powerful tool for imaging and manipulating matter at the nanoscale. An optimal control problem is proposed for the control of AFMs which includes the design of a sample-profile estimate signal in addition to the set-point regulation and resolution objectives. A new estimate signal for the sample profile is proposed and it is proved that the transfer function between the profile signal and the estimate signal is unity. The main contribution in comparison to existing designs is that there is no bandwidth limitation on estimation of sample profiles! Experimental results are presented to corroborate these results.

Original languageEnglish (US)
Pages (from-to)821-837
Number of pages17
JournalInternational Journal of Robust and Nonlinear Control
Volume15
Issue number16
DOIs
StatePublished - Nov 10 2005

Keywords

  • Atomic force microscopy
  • Estimation
  • Fast scan
  • Robust control
  • Sample profile

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Chemical Engineering(all)
  • Biomedical Engineering
  • Aerospace Engineering
  • Mechanical Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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