A RF CMOS amplifier with optimized gain, noise, linearity and return losses for UWB applications

Giang D. Nguyen, Kurt Cimino, Milton Feng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Trade-off between noise figure (NF) and input return loss (RL or |S 11|) imposes a fundamental limitation on the design of low noise amplifiers (LNA) for ultra-wideband (UWB) applications. A graph-based approach using Smith Chart to achieve optimum values for both NF and input RL over the desired LNA bandwidth is presented. The proposed method and device optimization technique are systematically incorporated to enhance the overall LNA performance in terms of gain, noise, linearity, and power consumption. An UWB LNA prototype is implemented in a 0.13pm CMOS process to demonstrate the use of this methodology. It shows a gain of 11.3 dB, a NF of 3.9-4.6 dB, and an IIP3 of 3.2-5dBm over a -3dB bandwidth of 2.2-9GHz while consuming 30mW from a 1.2V DC supply.

Original languageEnglish (US)
Title of host publicationProceedings of the 2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008
Pages505-508
Number of pages4
DOIs
StatePublished - Sep 22 2008
Event2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008 - Atlanta, GA, United States
Duration: Jun 15 2008Jun 17 2008

Publication series

NameDigest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN (Print)1529-2517

Other

Other2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008
CountryUnited States
CityAtlanta, GA
Period6/15/086/17/08

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Keywords

  • CMOS
  • Low noise amplifier (LNA)
  • Noise matching
  • Smith chart
  • Ultra-wideband (UWB)

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Nguyen, G. D., Cimino, K., & Feng, M. (2008). A RF CMOS amplifier with optimized gain, noise, linearity and return losses for UWB applications. In Proceedings of the 2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008 (pp. 505-508). [4561487] (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2008.4561487