A novel testing approach for full-chip CDM characterization

Alex Gerdemann, Elyse Rosenbaum, Michael Stockinger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work describes a new testing system for use in measuring the full-chip response to CDM-like discharge phenomena. It includes a new form of the cc-TLP system and monitoring strategies that allow measurement of internal voltage waveforms during a discharge.

Original languageEnglish (US)
Title of host publication2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD
DOIs
StatePublished - Dec 1 2007
Event2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD - Anaheim, CA, United States
Duration: Sep 16 2007Sep 21 2007

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Other

Other2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD
CountryUnited States
CityAnaheim, CA
Period9/16/079/21/07

ASJC Scopus subject areas

  • Condensed Matter Physics

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  • Cite this

    Gerdemann, A., Rosenbaum, E., & Stockinger, M. (2007). A novel testing approach for full-chip CDM characterization. In 2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD [4401765] (Electrical Overstress/Electrostatic Discharge Symposium Proceedings). https://doi.org/10.1109/EOSESD.2007.4401765