@inproceedings{b5a6956c3c4c4a1eae127c120c25cf6d,
title = "A novel testing approach for full-chip CDM characterization",
abstract = "This work describes a new testing system for use in measuring the full-chip response to CDM-like discharge phenomena. It includes a new form of the cc-TLP system and monitoring strategies that allow measurement of internal voltage waveforms during a discharge.",
author = "Alex Gerdemann and Elyse Rosenbaum and Michael Stockinger",
year = "2007",
doi = "10.1109/EOSESD.2007.4401765",
language = "English (US)",
isbn = "158537136X",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
pages = "5A.31--5A.38",
booktitle = "2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD",
note = "2007 29th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD ; Conference date: 16-09-2007 Through 21-09-2007",
}