A New Dynamic Imaging Mode for High-Resolution and High-Bandwidth Atomic Force Microscopy

Ram Sai Gorugantu, Srinivasa M. Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ahstract- This paper proposes a new high-bandwidth mode of imaging in an Atomic Force Microscope (AFM). This is achieved by regulating the gap between the sample and the vibrating cantilever tip to an appropriate sinusoidal signal with frequency close to the cantilever resonant frequency. This scheme utilizes the deflection signal of the cantilever instead of its derivatives such as amplitude and phase. We design the regulating controller using ∞mixed synthesis. Another major advantage of this approach is that we exploit a structure where sample topography estimation can be accurately done even at frequencies beyond the bandwidth of disturbance rejection resulting from the ∞ optimal controller. Simulation results show an order of magnitude improvement in bandwidth over conventional tapping mode imaging. Experimental implementation of this new imaging mode is ongoing.

Original languageEnglish (US)
Title of host publication2018 Annual American Control Conference, ACC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages6018-6023
Number of pages6
ISBN (Print)9781538654286
DOIs
StatePublished - Aug 9 2018
Event2018 Annual American Control Conference, ACC 2018 - Milwauke, United States
Duration: Jun 27 2018Jun 29 2018

Publication series

NameProceedings of the American Control Conference
Volume2018-June
ISSN (Print)0743-1619

Other

Other2018 Annual American Control Conference, ACC 2018
CountryUnited States
CityMilwauke
Period6/27/186/29/18

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Gorugantu, R. S., & Salapaka, S. M. (2018). A New Dynamic Imaging Mode for High-Resolution and High-Bandwidth Atomic Force Microscopy. In 2018 Annual American Control Conference, ACC 2018 (pp. 6018-6023). [8431693] (Proceedings of the American Control Conference; Vol. 2018-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/ACC.2018.8431693